Granted Patent
Utility
US 5,677,913 · App. 08/674,354
Method and apparatus for efficient self testing of on-chip memory
Inventor:
Gunes Aybay
Patented Case
View Patent ↗
Granted: Oct 14, 1997
Filed: Jul 1, 1996
Inventor
Gunes Aybay
Assignee (at issue)
Sun Microsystems Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.