Granted Patent
Utility
US 5,678,031 · App. 08/457,576
Method of testing interconnections of an LSI on a simulator through the use of effective pulse widths
Inventor:
Akihiro Shiratori
Patented Case
View Patent ↗
Granted: Oct 14, 1997
Filed: Jun 1, 1995
Inventor
Akihiro Shiratori
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.