Granted Patent
Utility
US 5,680,039 · App. 08/382,501
Probe apparatus for use in both high and low frequency measurements
Inventors:
Kohei Mochizuki, Satoshi Habu
Patented Case
View Patent ↗
Granted: Oct 21, 1997
Filed: Feb 2, 1995
Inventors
Kohei Mochizuki
Satoshi Habu
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.