Granted Patent
Utility
US 5,701,087 · App. 08/520,783
Prescaler IC test method capable of executing alternate current test by the use of IC tester for direct current test
Inventor:
Isamu Takano
Patented Case
View Patent ↗
Granted: Dec 23, 1997
Filed: Aug 30, 1995
Inventor
Isamu Takano
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.