Granted Patent
Utility
US 5,708,601 · App. 08/602,237
Integrated circuitry for checking the utilization rate of redundancy memory elements in a semiconductor memory device
Inventors:
Vernon G. McKenny, Luigi Pascucci, Marco Maccarrone
Patented Case
View Patent ↗
Granted: Jan 13, 1998
Filed: Feb 16, 1996
Inventors
Vernon G. McKenny
Luigi Pascucci
Marco Maccarrone
Assignee (at issue)
SGS-Thomson Microelectronics S.A.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.