IP Library › Granted Patent US 5,717,643
Granted Patent Utility
US 5,717,643 · App. 08/715,069

Semiconductor memory device with testing function

Inventors: Eiichi Iwanami, Toshio Wada
Patented Case View Patent ↗
Granted: Feb 10, 1998 Filed: Sep 19, 1996
Inventors
Eiichi Iwanami
Toshio Wada
Assignee (at issue)
Nippon Steel Semiconductor Corporation

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Quick Facts
Patent No.
US 5,717,643
App. No.
08/715,069
Filed
1996-09-19
Granted
1998-02-10
Kind
A