IP Library Granted Patent US 5,717,652
Granted Patent Utility
US 5,717,652 · App. 08/589,358

Semiconductor memory device capable of high speed plural parallel test, method of data writing therefor and parallel tester

Inventor: Tsukasa Ooishi
Patented Case View Patent ↗
Granted: Feb 10, 1998 Filed: Jan 22, 1996
Inventor
Tsukasa Ooishi
Assignee (at issue)
MITSUBISHI ELECTRIC CORPORATION

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Quick Facts
Patent No.
US 5,717,652
App. No.
08/589,358
Filed
1996-01-22
Granted
1998-02-10
Kind
A