Granted Patent
Utility
US 5,717,652 · App. 08/589,358
Semiconductor memory device capable of high speed plural parallel test, method of data writing therefor and parallel tester
Inventor:
Tsukasa Ooishi
Patented Case
View Patent ↗
Granted: Feb 10, 1998
Filed: Jan 22, 1996
Inventor
Tsukasa Ooishi
Assignee (at issue)
MITSUBISHI ELECTRIC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.