Granted Patent
Utility
US 5,729,622 · App. 08/510,226
Automatic inspection system for contactlessly measuring an offset of a central feature of an object
Inventors:
Andrei Csipkes, John Mark Palmquist
Patented Case
View Patent ↗
Granted: Mar 17, 1998
Filed: Aug 2, 1995
Inventors
Andrei Csipkes
John Mark Palmquist
Assignee (at issue)
LUCENT TECHNOLOGIES INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.