Granted Patent
Utility
US 5,734,199 · App. 08/767,778
Semiconductor device having improved test electrodes
Inventors:
Tetsuo Kawakita, Kazuhiko Matsumura, Ichiro Yamane
Patented Case
View Patent ↗
Granted: Mar 31, 1998
Filed: Dec 17, 1996
Inventors
Tetsuo Kawakita
Kazuhiko Matsumura
Ichiro Yamane
Assignees (at issue)
SUMITOMO ELECTRIC INDUSTRIES, LTD.
Matsushita Electronics Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.