Granted Patent
Utility
US 5,737,342 · App. 08/656,021
Method for in-chip testing of digital circuits of a synchronously sampled data detection channel
Inventor:
Pablo A. Ziperovich
Patented Case
View Patent ↗
Granted: Apr 7, 1998
Filed: May 31, 1996
Inventor
Pablo A. Ziperovich
Assignee (at issue)
Quantum Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.