IP Library Granted Patent US 5,745,592
Granted Patent Utility
US 5,745,592 · App. 08/508,573

Method for detecting forgery in a traced signature by measuring an amount of jitter

Inventor: Vishvjit Singh Nalwa
Patented Case View Patent ↗
Granted: Apr 28, 1998 Filed: Jul 27, 1995
Inventor
Vishvjit Singh Nalwa
Assignee (at issue)
LUCENT TECHNOLOGIES INC.

This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.

Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 5,745,592
App. No.
08/508,573
Filed
1995-07-27
Granted
1998-04-28
Kind
A