Granted Patent
Utility
US 5,748,545 · App. 08/834,775
Memory device with on-chip manufacturing and memory cell defect detection capability
Inventors:
Peter Wung Lee, Hsing-Ya Tsao, Fu-Chang Hsu
Patented Case
View Patent ↗
Granted: May 5, 1998
Filed: Apr 3, 1997
Inventors
Peter Wung Lee
Hsing-Ya Tsao
Fu-Chang Hsu
Assignee (at issue)
Aplus Integrated Circuits, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.