Granted Patent
Utility
US 5,757,474 · App. 08/496,061
System for characterizing semiconductor materials and photovoltaic devices through calibration
Inventors:
Bhushan L. Sopori, Larry C. Allen, Craig Marshall, Robert Cornelius Murphy, Todd Steven Marshall
Patented Case
View Patent ↗
Granted: May 26, 1998
Filed: Jun 28, 1995
Inventors
Bhushan L. Sopori
Larry C. Allen
Craig Marshall
Robert Cornelius Murphy
Todd Steven Marshall
Assignee (at issue)
Midwest Research Institute, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.