Granted Patent
Utility
US 5,760,445 · App. 08/822,365
Device and method of manufacture for protection against plasma charging damage in advanced MOS technologies
Inventor:
Carlos H. Diaz
Patented Case
View Patent ↗
Granted: Jun 2, 1998
Filed: Mar 20, 1997
Inventor
Carlos H. Diaz
Assignee (at issue)
Hewlett-Packard Company, L.P.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.