Granted Patent
Utility
US 5,760,600 · App. 08/917,757
Test device for insulated-gate field effect transistor and testing circuit and testing method using the same
Inventor:
Naoki Kasai
Patented Case
View Patent ↗
Granted: Jun 2, 1998
Filed: Aug 27, 1997
Inventor
Naoki Kasai
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.