Granted Patent
Utility
US 5,764,070 · App. 08/603,602
Structure for testing bare integrated circuit devices
Inventor:
David J. Pedder
Patented Case
View Patent ↗
Granted: Jun 9, 1998
Filed: Feb 21, 1996
Inventor
David J. Pedder
Assignee (at issue)
Plessey Semiconductors Ltd
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.