Granted Patent
Utility
US 5,771,191 · App. 08/838,984
Method and system for inspecting semiconductor memory device
Inventor:
Kazuki Matsue
Patented Case
View Patent ↗
Granted: Jun 23, 1998
Filed: Apr 23, 1997
Inventor
Kazuki Matsue
Assignee (at issue)
SHARP KABUSHIKI KAISHA
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.