Granted Patent
Utility
US 5,777,482 · App. 08/675,590
Circuit arrangement and method for measuring a difference in capacitance between a first capacitance C.sub.1 and a second capacitance C.sub.2
Inventors:
Reinhard Tielert, Andreas Hildebrandt
Patented Case
View Patent ↗
Granted: Jul 7, 1998
Filed: Jul 3, 1996
Inventors
Reinhard Tielert
Andreas Hildebrandt
Assignee (at issue)
Siemens Aktiengesellschaft
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.