IP Library Granted Patent US 5,777,482
Granted Patent Utility
US 5,777,482 · App. 08/675,590

Circuit arrangement and method for measuring a difference in capacitance between a first capacitance C.sub.1 and a second capacitance C.sub.2

Inventors: Reinhard Tielert, Andreas Hildebrandt
Patented Case View Patent ↗
Granted: Jul 7, 1998 Filed: Jul 3, 1996
Inventors
Reinhard Tielert
Andreas Hildebrandt
Assignee (at issue)
Siemens Aktiengesellschaft

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Quick Facts
Patent No.
US 5,777,482
App. No.
08/675,590
Filed
1996-07-03
Granted
1998-07-07
Kind
A