Granted Patent
Utility
US 5,777,932 · App. 08/736,402
Semiconductor memory device test circuit having an improved compare signal generator circuit
Inventor:
Toru Chonan
Patented Case
View Patent ↗
Granted: Jul 7, 1998
Filed: Oct 24, 1996
Inventor
Toru Chonan
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.