Granted Patent
Utility
US 5,780,896 · App. 08/769,423
Semiconductor device having shallow impurity region without short-circuit between gate electrode and source and drain regions and process of fabrication thereof
Inventor:
Atsuki Ono
Patented Case
View Patent ↗
Granted: Jul 14, 1998
Filed: Dec 19, 1996
Inventor
Atsuki Ono
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.