IP Library Granted Patent US 5,780,896
Granted Patent Utility
US 5,780,896 · App. 08/769,423

Semiconductor device having shallow impurity region without short-circuit between gate electrode and source and drain regions and process of fabrication thereof

Inventor: Atsuki Ono
Patented Case View Patent ↗
Granted: Jul 14, 1998 Filed: Dec 19, 1996
Inventor
Atsuki Ono
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 5,780,896
App. No.
08/769,423
Filed
1996-12-19
Granted
1998-07-14
Kind
A