Granted Patent
Utility
US 5,790,463 · App. 08/814,778
On-chip mobile ion contamination test circuit
Inventor:
Gary R. Gilliam
Patented Case
View Patent ↗
Granted: Aug 4, 1998
Filed: Mar 10, 1997
Inventor
Gary R. Gilliam
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.