Granted Patent
Utility
US 5,802,001 · App. 08/905,955
Burn-in checking apparatus for semiconductor memory device
Inventor:
Tae H. Kim
Patented Case
View Patent ↗
Granted: Sep 1, 1998
Filed: Aug 5, 1997
Inventor
Tae H. Kim
Assignee (at issue)
LG Semicon Co., Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.