Granted Patent
Utility
US 5,812,460 · App. 08/974,670
Nonvolatile semiconductor memory device having test circuit for testing erasing function thereof
Inventor:
Hiroyuki Kobatake
Patented Case
View Patent ↗
Granted: Sep 22, 1998
Filed: Nov 19, 1997
Inventor
Hiroyuki Kobatake
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.