Granted Patent
Utility
US 5,822,396 · App. 08/893,283
Calibration system and method for x-ray geometry
Inventors:
Nassir Navab, Ali Bani-Hashemi
Patented Case
View Patent ↗
Granted: Oct 13, 1998
Filed: Jul 15, 1997
Inventors
Nassir Navab
Ali Bani-Hashemi
Assignee (at issue)
Siemens Corporate Research, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.