IP Library Granted Patent US 5,841,271
Granted Patent Utility
US 5,841,271 · App. 08/906,824

Test mode power circuit for integrated-circuit chip

Inventor: Hiroshi Nakayama
Patented Case View Patent ↗
Granted: Nov 24, 1998 Filed: Aug 6, 1997
Inventor
Hiroshi Nakayama
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 5,841,271
App. No.
08/906,824
Filed
1997-08-06
Granted
1998-11-24
Kind
A