Granted Patent
Utility
US 5,841,713 · App. 08/111,158
Wafer test method capable of completing a wafer test in a short time
Inventor:
Tetsunori Maeda
Patented Case
View Patent ↗
Granted: Nov 24, 1998
Filed: Jul 7, 1998
Inventor
Tetsunori Maeda
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.