Granted Patent
Utility
US 5,844,421 · App. 08/645,498
Probe control method for leveling probe pins for a probe test sequence
Inventors:
Si-Hyoung Lee, Seung Hwan Park, Kyoung-Ho Yang, Gun-Won Lee
Patented Case
View Patent ↗
Granted: Dec 1, 1998
Filed: May 16, 1996
Inventors
Si-Hyoung Lee
Seung Hwan Park
Kyoung-Ho Yang
Gun-Won Lee
Assignee (at issue)
SAMSUNG ELECTRONICS SO., LTD
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.