Granted Patent
Utility
US 5,844,909 · App. 08/827,193
Test pattern selection method for testing of integrated circuit
Inventor:
Kazuo Wakui
Patented Case
View Patent ↗
Granted: Dec 1, 1998
Filed: Mar 27, 1997
Inventor
Kazuo Wakui
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.