Granted Patent
Utility
US 5,847,366 · App. 08/668,045
Apparatus and method for controlling the temperature of an integrated circuit under test
Inventor:
David R. Grunfeld
Patented Case
View Patent ↗
Granted: Dec 8, 1998
Filed: Jun 18, 1996
Inventor
David R. Grunfeld
Assignee (at issue)
Intel Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.