Granted Patent
Utility
US 5,854,487 · App. 08/808,351
Scanning probe microscope providing unobstructed top down and bottom up views
Inventors:
David Braunstein, Michael D. Kirk, Quoc Ly, Thai Nguyen
Patented Case
View Patent ↗
Granted: Dec 29, 1998
Filed: Feb 28, 1997
Inventors
David Braunstein
Michael D. Kirk
Quoc Ly
Thai Nguyen
Assignee (at issue)
Park Scientific Instruments
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.