Granted Patent
Utility
US 5,867,276 · App. 08/814,736
Method for broad wavelength scatterometry
Inventors:
John R. McNeil, Scott Wilson, Richard H. Krukar
Patented Case
View Patent ↗
Granted: Feb 2, 1999
Filed: Mar 7, 1997
Inventors
John R. McNeil
Scott Wilson
Richard H. Krukar
Assignee (at issue)
Bio-Rad Laboratories, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.