IP Library › Granted Patent US 5,870,043
Granted Patent Utility
US 5,870,043 · App. 08/883,662

Pla dac circuit employing a test function

Inventor: Mitsuhisa Hiromi
Patented Case View Patent ↗
Granted: Feb 9, 1999 Filed: Jun 27, 1997
Inventor
Mitsuhisa Hiromi
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 5,870,043
App. No.
08/883,662
Filed
1997-06-27
Granted
1999-02-09
Kind
A