Granted Patent
Utility
US 5,898,752 · App. 08/959,219
X-ray analysis apparatus provided with a double collimator mask
Inventor:
Hendricus G. M. Van Der Wal
Patented Case
View Patent ↗
Granted: Apr 27, 1999
Filed: Oct 28, 1997
Inventor
Hendricus G. M. Van Der Wal
Assignee (at issue)
U.S. Philips Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.