Granted Patent
Utility
US 5,900,645 · App. 08/976,082
Semiconductor device and method of testing the same
Inventor:
Yoshiaki Yamada
Patented Case
View Patent ↗
Granted: May 4, 1999
Filed: Nov 21, 1997
Inventor
Yoshiaki Yamada
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.