Granted Patent
Utility
US 5,910,922 · App. 08/906,448
Method for testing data retention in a static random access memory using isolated V.sub.cc supply
Inventors:
Alan H. Huggins, William L. Devanney, Chuen-Der Lien
Patented Case
View Patent ↗
Granted: Jun 8, 1999
Filed: Aug 5, 1997
Inventors
Alan H. Huggins
William L. Devanney
Chuen-Der Lien
Assignee (at issue)
Integrated Device Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.