Granted Patent
Utility
US 5,915,196 · App. 08/746,486
Method of forming shallow diffusion layers in a semiconductor substrate in the vicinity of a gate electrode
Inventor:
Akira Mineji
Patented Case
View Patent ↗
Granted: Jun 22, 1999
Filed: Nov 12, 1996
Inventor
Akira Mineji
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.