IP Library Granted Patent US 5,915,196
Granted Patent Utility
US 5,915,196 · App. 08/746,486

Method of forming shallow diffusion layers in a semiconductor substrate in the vicinity of a gate electrode

Inventor: Akira Mineji
Patented Case View Patent ↗
Granted: Jun 22, 1999 Filed: Nov 12, 1996
Inventor
Akira Mineji
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 5,915,196
App. No.
08/746,486
Filed
1996-11-12
Granted
1999-06-22
Kind
A