IP Library Granted Patent US 5,917,331
Granted Patent Utility
US 5,917,331 · App. 08/546,751

Integrated circuit test method and structure

Inventor: Thomas W. Persons
Patented Case View Patent ↗
Granted: Jun 29, 1999 Filed: Oct 23, 1995
Inventor
Thomas W. Persons
Assignee (at issue)
Megatest Corporation

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Quick Facts
Patent No.
US 5,917,331
App. No.
08/546,751
Filed
1995-10-23
Granted
1999-06-29
Kind
A