Granted Patent
Utility
US 5,920,574 · App. 08/932,894
Method for accelerated test of semiconductor devices
Inventors:
Yasuhiro Shimada, Keisaku Nakao, Atsuo Inoue, Masamichi Azuma, Eiji Fujii
Patented Case
View Patent ↗
Granted: Jul 6, 1999
Filed: Sep 18, 1997
Inventors
Yasuhiro Shimada
Keisaku Nakao
Atsuo Inoue
Masamichi Azuma
Eiji Fujii
Assignee (at issue)
Matsushita Electronics Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.