Granted Patent
Utility
US 5,923,675 · App. 08/803,111
Semiconductor tester for testing devices with embedded memory
Inventors:
Benjamin J. Brown, John F. Donaldson, Kurt B. Gusinow
Patented Case
View Patent ↗
Granted: Jul 13, 1999
Filed: Feb 20, 1997
Inventors
Benjamin J. Brown
John F. Donaldson
Kurt B. Gusinow
Assignee (at issue)
Teradyne, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.