Granted Patent
Utility
US 5,939,623 · App. 08/764,214
Scanning type near field interatomic force microscope
Inventors:
Hiroshi Muramatsu, Takeshi Umemoto
Patented Case
View Patent ↗
Granted: Aug 17, 1999
Filed: Dec 13, 1996
Inventors
Hiroshi Muramatsu
Takeshi Umemoto
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.