IP Library Granted Patent US 5,939,708
Granted Patent Utility
US 5,939,708 · App. 08/927,068

Alignment pattern and alignment method for a scanning system

Inventor: Jenn-Tsair Tsai
Patented Case View Patent ↗
Granted: Aug 17, 1999 Filed: Sep 10, 1997
Inventor
Jenn-Tsair Tsai
Assignee (at issue)
Mustek Systems Inc.

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Quick Facts
Patent No.
US 5,939,708
App. No.
08/927,068
Filed
1997-09-10
Granted
1999-08-17
Kind
A