IP Library › Granted Patent US 5,939,719
Granted Patent Utility
US 5,939,719 · App. 08/831,153

Scanning probe microscope with scan correction

Inventors: Sang-Il Park, Ian R. Smith, Michael D. Kirk
Patented Case View Patent ↗
Granted: Aug 17, 1999 Filed: Apr 1, 1997
Inventors
Sang-Il Park
Ian R. Smith
Michael D. Kirk
Assignee (at issue)
ThermoMicroscopes Corporation

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Quick Facts
Patent No.
US 5,939,719
App. No.
08/831,153
Filed
1997-04-01
Granted
1999-08-17
Kind
A