Granted Patent
Utility
US 5,939,894 · App. 08/741,424
CMOS integrated circuit testing method and apparatus using quiescent power supply currents database
Inventors:
Hisashi Yamauchi, Fumihiko Tajima, Yoshiyuki Inomata
Patented Case
View Patent ↗
Granted: Aug 17, 1999
Filed: Oct 24, 1996
Inventors
Hisashi Yamauchi
Fumihiko Tajima
Yoshiyuki Inomata
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.