Granted Patent
Utility
US 5,944,846 · App. 08/930,490
Method and apparatus for selectively testing identical pins of a plurality of electronic components
Inventors:
Jean-Claude Fournel, Daniel Chausse, Jean-Louis Murgue
Patented Case
View Patent ↗
Granted: Aug 31, 1999
Filed: Sep 30, 1997
Inventors
Jean-Claude Fournel
Daniel Chausse
Jean-Louis Murgue
Assignee (at issue)
Schlumberger Industires, S.A.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.