Granted Patent
Utility
US 5,949,798 · App. 08/795,354
Integrated circuit fault testing system based on power spectrum analysis of power supply current
Inventor:
Kazuhiro Sakaguchi
Patented Case
View Patent ↗
Granted: Sep 7, 1999
Filed: Feb 4, 1997
Inventor
Kazuhiro Sakaguchi
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.