Granted Patent
Utility
US 5,953,608 · App. 08/888,827
Method of forming a DRAM stacked capacitor using an etch blocking film of silicon oxide
Inventor:
Toshiyuki Hirota
Patented Case
View Patent ↗
Granted: Sep 14, 1999
Filed: Jul 7, 1997
Inventor
Toshiyuki Hirota
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.