IP Library Granted Patent US 5,953,608
Granted Patent Utility
US 5,953,608 · App. 08/888,827

Method of forming a DRAM stacked capacitor using an etch blocking film of silicon oxide

Inventor: Toshiyuki Hirota
Patented Case View Patent ↗
Granted: Sep 14, 1999 Filed: Jul 7, 1997
Inventor
Toshiyuki Hirota
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 5,953,608
App. No.
08/888,827
Filed
1997-07-07
Granted
1999-09-14
Kind
A