Granted Patent
Utility
US 5,961,656 · App. 08/551,117
Method and apparatus for testing memory devices under load
Inventors:
Billy J. Fuller, Thomas G. Whitten
Patented Case
View Patent ↗
Granted: Oct 5, 1999
Filed: Oct 31, 1995
Inventors
Billy J. Fuller
Thomas G. Whitten
Assignee (at issue)
Sun Microsystems Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.