Granted Patent
Utility
US 5,961,859 · App. 08/956,881
Method and apparatus for monitoring laser weld quality via plasma size measurements
Inventors:
Mau-Song Chou, Christopher Shih, Bryan W. Shirk
Patented Case
View Patent ↗
Granted: Oct 5, 1999
Filed: Oct 23, 1997
Inventors
Mau-Song Chou
Christopher Shih
Bryan W. Shirk
Assignee (at issue)
TRW Limited
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.