Granted Patent
Utility
US 5,963,792 · App. 09/094,062
Use of an oxide surface to facilitate gate break on a carrier substrate for a semiconductor device
Inventor:
Richard W. Wensel
Patented Case
View Patent ↗
Granted: Oct 5, 1999
Filed: Jun 9, 1998
Inventor
Richard W. Wensel
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.