Granted Patent
Utility
US 5,991,189 · App. 09/192,528
Ferroelectric random access memory devices having short-lived cell detector available for life test for ferroelectric capacitor and method for testing ferroelectric memory cells
Inventor:
Tohru Miwa
Patented Case
View Patent ↗
Granted: Nov 23, 1999
Filed: Nov 17, 1998
Inventor
Tohru Miwa
Assignee (at issue)
NEC CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.